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Wayne Kerr Electronics :
"Acknowledged worldwide for the quality, accuracy and the capability of its component measurement products"

LCR Meters

A range of easy to use LCR meters with comprehensive measurement functions.

Accurate and fast measurements may be made from 20Hz to 1MHz (43100) making the 4300 series the ideal choice for many applications in the test or production environments. All 4300 series instruments may be externally controlled using the standard RS232 or GPIB interfaces.



Our new LCR Meters 4300 series.
Please click to download info :


LCR Meter - Entry Level Range NEW!!

The 4100 series is the entry level range of Wayne Kerr LCR Meters. They provide a wide range of features and offer high performance and very competitive prices.

Our new LCR Meters 4100 series.
Please click to download info :




Capacitance Meters

The 6430B and 6440B Precision Component Analyzers provide thorough and accurate testing of any passive component to high resolution.
In particular, for capacitor manufacturers, the instruments provide capabilities for both fast automatic production testing and complete design characterisation.

Users include designers of passive components, manufacturing test, designing and testing materials as well as circuit designers who are evaluating component characteristics. The resonant frequency can be automatically calculated for any component together with its equivalent series or parallel circuit at that frequency.

Both instruments are designed for high performance testing of components, with a basic accuracy of 0.02%, at a low price. 6430B is the entry level instrument covering to 500 kHz whilst the fully featured 6440B covers to 3 MHz. To evaluate a component performance at high speed over a specified range of frequencies, multi frequency mode is used.

In this mode the operator decides which parameter is to be measured and at what frequencies. The 6430B and 6440B does the rest, creating an easy to read table on the large LCD display. Each test can have a simple Pass/Fail display.

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